Tiwald, Tom : rechercher sur Z-Library

Le plus grand référentiel d'articles scientifiques au monde. 70,000,000+ d'articles gratuitement.

Don't use scam websites

Livres
Articles (16)
Les plus populaires
Liste
- Liste
- Tableau

1

Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry

James N. Hilfiker, Neha Singh, Tom Tiwald, Diana Convey, Steven M. Smith, Jeffrey H. Baker, Harland G. Tompkins

Journal:

Thin Solid Films

Année:

2008

Langue:

english

Fichier:

PDF, 1.35 MB

english, 2008

2

VUV and IR spectroellipsometric studies of polymer surfaces

John A. Woollam, Corey Bungay, James Hilfiker, Tom Tiwald

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

2003

Langue:

english

Fichier:

PDF, 138 KB

english, 2003

3

Toward perfect antireflection coatings. 3. Experimental results obtained with the use of Reststrahlen materials

Dobrowolski, J. A., Guo, Yanen, Tiwald, Tom, Ma, Penghui, Poitras, Daniel

Journal:

Année:

2006

Langue:

english

Fichier:

PDF, 957 KB

english, 2006

4

Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry

Hilfiker, James N., Stadermann, Michael, Sun, Jianing, Tiwald, Tom, Hale, Jeffrey S., Miller, Philip E., Aracne-Ruddle, Chantel

Journal:

Applied Surface Science

Année:

2016

Langue:

english

Fichier:

PDF, 1.88 MB

english, 2016

5

Use of Molecular Vibrations to Analyze Very Thin Films with Infrared Ellipsometry

Tompkins, Harland G., Tiwald, Tom, Bungay, Corey, Hooper, Andrew E.

Journal:

Journal of Physical Chemistry B

Année:

2004

Langue:

english

Fichier:

PDF, 91 KB

english, 2004

6

Implementation of long-wavelength cut-off filters based on critical angle

Guo, Yanen, Dobrowolski, J. A., Li, Li, Poitras, Daniel, Tiwald, Tom

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 667 KB

english, 2011

7

Low-Stress Silicon Nitride Platform for Mid-Infrared Broadband and Monolithically Integrated Microphotonics

Lin, Pao Tai, Singh, Vivek, Lin, Hao-Yu Greg, Tiwald, Tom, Kimerling, Lionel C., Agarwal, Anuradha Murthy

Journal:

Advanced Optical Materials

Année:

2013

Langue:

english

Fichier:

PDF, 1.31 MB

english, 2013

8

Monitoring Organic Thin Film Growth In Aqueous Solution In-situ With A Combined Quartz Crystal Microbalance and Ellipsometry

Sarkar, Amitabha, Viitala, Tapani, Hofmann, Tino, Tiwald, Tom E., Woollam, John A., Kjerstad, Ann, Laderian, Bahar, Schubert, Mathias

Journal:

MRS Proceedings

Année:

2008

Langue:

english

Fichier:

PDF, 158 KB

english, 2008

9

Spectroscopic Mapping Ellipsometry of Graphene Grown on 3C SiC

Boosalis, Alexander, Hofmann, Tino, Darakchieva, Vanya, Yakimova, Rositza, Tiwald, Tom, Schubert, Mathias

Journal:

MRS Proceedings

Année:

2012

Langue:

english

Fichier:

PDF, 520 KB

english, 2012

10

Infrared Ellipsometry Investigation of Hydrogenated Amorphous Silicon

Gaspari, Franco, Shkrebtii, Anatoli, Tiwald, Tom E., Fuchser, Andrea, Ahmed, Shafiq Muhammad, Kosteski, Tome, Leong, Keith, Kherani, Nazir

Journal:

MRS Proceedings

Année:

2009

Langue:

english

Fichier:

PDF, 236 KB

english, 2009

11

[IEEE 2014 IEEE Avionics Fiber-Optics and Photonics Conference (AVFOP) - Atlanta, GA, USA (2014.11.11-2014.11.13)] 2014 IEEE Avionics, Fiber-Optics and Photonics Technology Conference (AVFOP) - Low-stress silicon nitride platform for broadband mid-infrared microphotonics

Lin, Pao Tai, Singh, Vivek, Lin, Hao-Yu Greg, Tiwald, Tom, Kimerling, Lionel C., Tan, Dawn T. H., Agarwal, Anuradha Murthy

Année:

2014

Langue:

english

Fichier:

PDF, 302 KB

english, 2014

12

Surface Modification of Nanocrystalline Cellulose toward a Tunable Optical Polarizer

Bolduc, Martin, Poirier, Michel, Chauve, Gregory, Oulachgar, Hassane, Tiwald, Tom, Laperle, Pierre, Gay, David, Beaupre, Patrick, Methot, Myriam, Leclerc, Melanie, Deshaies, Sebastien, Briand, Martin,

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 548 KB

english, 2016

13

Estimating Depolarization with the Jones Matrix Quality Factor

Hilfiker, James N., Hale, Jeffrey S., Herzinger, Craig M., Tiwald, Tom, Hong, Nina, Schöche, Stefan, Arwin, Hans

Journal:

Applied Surface Science

Année:

2016

Langue:

english

Fichier:

PDF, 2.61 MB

english, 2016

14

Robust Extraction of Hyperbolic Metamaterial Permittivity using Total Internal Reflection Ellipsometry

Zhang, Cheng, Hong, Nina, Ji, Chengang, Zhu, Wenqi, Chen, Xi, Agrawal, Amit, Zhang, Zhong, Tiwald, Tom E., Schoeche, Stefan, Hilfiker, James N., Guo, L. Jay, Lezec, Henri J.

Journal:

Année:

2018

Langue:

english

Fichier:

PDF, 1.21 MB

english, 2018

15

Extremely broadband ultralight thermally-emissive optical coatings

Naqavi, Ali, Loke, Samuel P., Kelzenberg, Michael D., Callahan, Dennis M., Tiwald, Tom, Warmann, Emily C., Espinet-González, Pilar, Vaidya, Nina, Roy, Tatiana A., Huang, Jing-Shun, Vinogradova, Tatian

Journal:

Année:

2018

Langue:

english

Fichier:

PDF, 4.52 MB

english, 2018

16

[OSA Optical Interference Coatings - Tucson, Arizona (2004..-..)] Optical Interference Coatings - Some reflections on the history of optical thin films

Dobrowolski, J. A., Guo, Yanen, Tiwald, Tom, Poitras, Daniel, Ma, Penghui

Année:

2004

Fichier:

PDF, 70 KB

2004